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Reliability Improvement in III-V Concentrator Solar Cells by Means of Perimeter Protection
Cita
González Ciprián, José Ramón, Vázquez López, Manuel 
ORCID: https://orcid.org/0000-0003-1070-1751, Núñez Mendoza, Neftalí ORCID: https://orcid.org/0000-0003-2339-2441, Algora del Valle, Carlos ORCID: https://orcid.org/0000-0003-1872-7243 and Espinet González, Pilar
(2010).
Reliability Improvement in III-V Concentrator Solar Cells by Means of Perimeter Protection.
En: "6th International Conference on Concentrating Photovoltaic Systems", 07/04/2010 - 09/04/2010, Friburgo, Alemania. ISBN 9780735408272.
ORCID: https://orcid.org/0000-0003-1070-1751, Núñez Mendoza, Neftalí ORCID: https://orcid.org/0000-0003-2339-2441, Algora del Valle, Carlos ORCID: https://orcid.org/0000-0003-1872-7243 and Espinet González, Pilar
(2010).
Reliability Improvement in III-V Concentrator Solar Cells by Means of Perimeter Protection.
En: "6th International Conference on Concentrating Photovoltaic Systems", 07/04/2010 - 09/04/2010, Friburgo, Alemania. ISBN 9780735408272.
Descripción
| Título: | Reliability Improvement in III-V Concentrator Solar Cells by Means of Perimeter Protection |
|---|---|
| Autor/es: |
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| Tipo de Documento: | Ponencia en Congreso o Jornada (Artículo) |
| Título del Evento: | 6th International Conference on Concentrating Photovoltaic Systems |
| Fechas del Evento: | 07/04/2010 - 09/04/2010 |
| Lugar del Evento: | Friburgo, Alemania |
| Título del Libro: | Proceedings of the 6th International Conference on Concentrating Photovoltaic Systems |
| Fecha: | 2010 |
| ISBN: | 9780735408272 |
| Materias: | |
| ODS: | |
| Palabras Clave Informales: | Reliability, Degradation, Qualification |
| Escuela: | E.T.S.I. Telecomunicación (UPM) |
| Departamento: | Electrónica Física |
| Licencias Creative Commons: | Reconocimiento - Sin obra derivada - No comercial |
Resumen
This paper presents the evolution in the strategy to assess the reliability of III-V solar cells and a new thermal ageing test carried out over GaAs single junction solar cells at three different temperatures (130, 150 and 170° C). The perimeter of the solar cells has been protected with silicone, which seems to be an effective way of enhancing the reliability of the solar cells. A preliminary analysis of the results indicates a mean time to failure (MTTF) one order of magnitude larger than the one obtained in a previous thermal test with the perimeter uncoated.
Más información
| ID de Registro: | 8251 |
|---|---|
| Identificador DC: | https://oa.upm.es/8251/ |
| Identificador OAI: | oai:oa.upm.es:8251 |
| URL Oficial: | http://www.cpv-6.org/cms/ |
| Depositado por: | Memoria Investigacion |
| Depositado el: | 01 Ago 2011 09:29 |
| Ultima Modificación: | 05 Mar 2024 15:13 |
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