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ORCID: https://orcid.org/0000-0002-9895-2020, Ochoa Gómez, Mario
ORCID: https://orcid.org/0000-0002-7108-3638, Lombardero, Iván, Cifuentes, Luis, Hinojosa, Manuel, Caño, Pablo, Rey-Stolle Prado, Ignacio
ORCID: https://orcid.org/0000-0002-4919-5609, Algora del Valle, Carlos
ORCID: https://orcid.org/0000-0003-1872-7243, Johnson, A.D., Davies, J.I., Tan, K.H., Loke, W.K., Wicaksono, S. and Yoon, F.
(2017).
Degradation of subcells and tunnel junctions during growth of GaInP/Ga(In)As/GaNAsSb/Ge 4-junction solar cells.
"Progress in Photovoltaics: Research and Applications", v. N/A
(n. N/A);
pp. 1-9.
ISSN 1099-159X.
https://doi.org/10.1002/pip.2930.
| Título: | Degradation of subcells and tunnel junctions during growth of GaInP/Ga(In)As/GaNAsSb/Ge 4-junction solar cells |
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| Autor/es: |
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| Tipo de Documento: | Artículo |
| Título de Revista/Publicación: | Progress in Photovoltaics: Research and Applications |
| Fecha: | Septiembre 2017 |
| ISSN: | 1099-159X |
| Volumen: | N/A |
| Número: | N/A |
| Materias: | |
| ODS: | |
| Palabras Clave Informales: | degradation,dilute nitride, 4-junction solar cell, MOVPE, thermal load |
| Escuela: | Instituto de Energía Solar (IES) (UPM) |
| Departamento: | Electrónica Física |
| Grupo Investigación UPM: | Semiconductores III-V |
| Licencias Creative Commons: | Ninguna |
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A GaInP/Ga(In)As/GaNAsSb/Ge 4J solar cell grown using the combined MOVPE + MBE method is presented. This structure is used as a test bench to assess the effects caused by the integration of subcells and tunnel junctions into the full 4J structure. A significant degradation of the Ge bottom subcell emitter is observed during the growth of the GaNAsSb subcell, with a drop in the carrier collection efficiency at the high energy photon range that causes a ~15% lower Jsc and a Voc drop of ~50 mV at 1-sun. The Voc of the GaNAsSb subcell is shown to drop by as much as ~140 mV at 1-sun. No degradation in performance is observed in the tunnel junctions, and no further degradation is neither observed for the Ge subcell during the growth of the GaInP/Ga(In)As subcells. The hindered efficiency potential in this lattice-matched 4J architecture due to the degradation of the Ge and GaNAsSb subcells is discussed.
(C) John Wiley & Sons Ltd
| ID de Registro: | 47859 |
|---|---|
| Identificador DC: | https://oa.upm.es/47859/ |
| Identificador OAI: | oai:oa.upm.es:47859 |
| URL Portal Científico: | https://portalcientifico.upm.es/es/ipublic/item/3110728 |
| Identificador DOI: | 10.1002/pip.2930 |
| URL Oficial: | http://onlinelibrary.wiley.com/doi/10.1002/pip.293... |
| Depositado por: | Dr. Iván García Vara |
| Depositado el: | 26 Sep 2017 08:39 |
| Ultima Modificación: | 12 Nov 2025 00:00 |
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