Characterization of an analog-to-digital converter frequency response by a Josephson arbitrary waveform synthesizer

Diaz de Aguilar, Javier and Salinas, J.R. and Kieler, Oliver and Caballero, Raul and Behr, Ralf and Sanmamed, Yolanda A. and Méndez Jarque, A. (2019). Characterization of an analog-to-digital converter frequency response by a Josephson arbitrary waveform synthesizer. "Measurement Science and Technology", v. 30 (n. 3); ISSN 0957-0233. https://doi.org/10.1088/1361-6501/aafb27.

Description

Title: Characterization of an analog-to-digital converter frequency response by a Josephson arbitrary waveform synthesizer
Author/s:
  • Diaz de Aguilar, Javier
  • Salinas, J.R.
  • Kieler, Oliver
  • Caballero, Raul
  • Behr, Ralf
  • Sanmamed, Yolanda A.
  • Méndez Jarque, A.
Item Type: Article
Título de Revista/Publicación: Measurement Science and Technology
Date: February 2019
ISSN: 0957-0233
Volume: 30
Subjects:
Freetext Keywords: Quantum standard; digital converter; Josephson arbitrary waveform synthesizer; programmable Josephson voltage standard; Monte Carlo method; Sine fitting algorithms; artificial neural network (ANN)
Faculty: E.T.S.I. Aeronáuticos (UPM)
Department: Mecánica de Fluidos y Propulsión Aeroespacial
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

The capability to generate up to 1 V pure AC signals based on quantum standards marked a milestone on electrical metrology opening new applications that were not possible without this standard. Frequency response characterization of analog-to-digital converters (ADC) is fundamental for precision digital metrology. Several methods have been investigated for this characterization based on thermal converters, programmable Josephson voltage standard or input impedance measurements. This paper describes the method, the results obtained and the uncertainty estimation for the characterization of the amplitude frequency response at different aperture times of the DCV sampling function of the Keysight 3458-A using, for the first time, a Josephson arbitrary waveform synthesizer. This new standard allows one to extend the characterization to a higher frequency range and lower aperture times. The results show that the frequency response does not depend on aperture time and the same frequency correction can be applied in an extended frequency range. The knowledge of this correction will facilitate the application of the ADCs to higher frequencies, where low aperture times are required with accuracy in the order of V/V.

Funding Projects

TypeCodeAcronymLeaderTitle
Horizon 2020SIB59Q-WAVEUnspecifiedA quantum standard for sampled electrical measurements
Horizon 202014RPT01ACQ-PROUnspecifiedTowards the propagation of ac quantum voltage standards
Horizon 202015RPT04TracePQMUnspecifiedTraceability routes for electrical power quality measurements

More information

Item ID: 64159
DC Identifier: https://oa.upm.es/64159/
OAI Identifier: oai:oa.upm.es:64159
DOI: 10.1088/1361-6501/aafb27
Official URL: https://iopscience.iop.org/article/10.1088/1361-6501/aafb27
Deposited by: Memoria Investigacion
Deposited on: 12 Mar 2021 07:56
Last Modified: 21 May 2021 09:24
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