Uncertainty in ellipse fitting using a flatbed scanner: development and experimental verification

Vicente Oliva, Jesús de; Sanchez Perez, Angel M.; Berzal Rubio, Miguel; Maresca, Piera y Gomez Garcia, Emilio (2014). Uncertainty in ellipse fitting using a flatbed scanner: development and experimental verification. "Measurement Science and Technology", v. 25 (n. 1); pp. 1-10. ISSN 0957-0233. https://doi.org/10.1088/0957-0233/25/1/015005.

Descripción

Título: Uncertainty in ellipse fitting using a flatbed scanner: development and experimental verification
Autor/es:
  • Vicente Oliva, Jesús de
  • Sanchez Perez, Angel M.
  • Berzal Rubio, Miguel
  • Maresca, Piera
  • Gomez Garcia, Emilio
Tipo de Documento: Artículo
Título de Revista/Publicación: Measurement Science and Technology
Fecha: Enero 2014
Volumen: 25
Materias:
Palabras Clave Informales: optical dimensional metrology, correlation, measurement uncertainty, least square method, orthogonal distance, flatbed scanner, cut-off length
Escuela: E.T.S.I. Industriales (UPM)
Departamento: Física Aplicada a la Ingeniería Industrial [hasta 2014]
Licencias Creative Commons: Reconocimiento - Sin obra derivada - No comercial

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Resumen

In the field of dimensional metrology, the use of optical measuring machines requires the handling of a large number of measurement points, or scanning points, taken from the image of the measurand. The presence of correlation between these measurement points has a significant influence on the uncertainty of the result. The aim of this work is the development of an estimation procedure for the uncertainty of measurement in a geometrically elliptical shape, taking into account the correlation between the scanning points. These points are obtained from an image produced using a commercial flat bed scanner. The characteristic parameters of the ellipse (coordinates of the center, semi-axes and the angle of the semi-major axis with regard to the horizontal) are determined using a least squares fit and orthogonal distance regression. The uncertainty is estimated using the information from the auto-correlation function of the residuals and is propagated through the fitting algorithm according to the rules described in Evaluation of Measurement Data—Supplement 2 to the ‘Guide to the Expression of Uncertainty in Measurement’—Extension to any number of output quantities. By introducing the concept of cut-off length, it can be observed how it is possible to take into account the presence of the correlation in the estimation of uncertainty in a very simple way while avoiding underestimation.

Más información

ID de Registro: 33229
Identificador DC: http://oa.upm.es/33229/
Identificador OAI: oai:oa.upm.es:33229
Identificador DOI: 10.1088/0957-0233/25/1/015005
URL Oficial: http://iopscience.iop.org/0957-0233/25/1/015005/article
Depositado por: Memoria Investigacion
Depositado el: 17 Abr 2015 16:00
Ultima Modificación: 10 Nov 2017 15:19
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